发明名称 POLISHING COMPOSITION
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a polishing composition for polishing a tungsten film and an insulation film at a high selective rate while scarcely causing erosion. <P>SOLUTION: The polishing composition contains colloidal silicon dioxide having average primary particle size of 7-40 nm, malonic acid, hydroxide, iron nitrate and water. The malonic acid is added in the content of 10-100 g/L and the hydroxide is used for pH control. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009206151(A) 申请公布日期 2009.09.10
申请号 JP20080044446 申请日期 2008.02.26
申请人 FUJIMI INC 发明人 HATTORI MASAYUKI;SATO HIDEYUKI
分类号 H01L21/304;B24B37/00;B82Y10/00;B82Y99/00;C09K3/14 主分类号 H01L21/304
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