发明名称 |
APPARATUS AND METHOD FOR PROCESSING PLASMA |
摘要 |
PROBLEM TO BE SOLVED: To improve the rate of operation in a plasma processing apparatus and maintain appropriate plasma processing capacity for a long period. SOLUTION: The plasma processing apparatus includes: a processing chamber which includes a substrate electrode 112 to place a substrate to be processed and a gas supply device 109 to supply a process gas at a specified flow rate; a vacuum discharge means 118 which can control pressure or gas density in the processing chamber and change gas discharging speed; and a mechanism 101 to generate plasma in the processing chamber. Thus, the density of a gas in the processing chamber is controlled uniform by the mechanism for measuring the density thereof based on the measured gas density. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009206344(A) |
申请公布日期 |
2009.09.10 |
申请号 |
JP20080048082 |
申请日期 |
2008.02.28 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
TAMURA HITOSHI;TANAKA MOTOHIRO;NISHIMORI YASUHIRO;SAKAGUCHI MASAMICHI |
分类号 |
H01L21/3065 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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