| 摘要 |
PROBLEM TO BE SOLVED: To provide a method capable of evaluating the surface shape of a component for an electrophotographic device, such as, electrophotographic photoreceptor, in more detail than in conventional methods. SOLUTION: A one-dimensional data array acquired by measuring by a surface roughness meter, a surface irregularity shape of the component for the electrophotographic device, such, as the electrophotographic photoreceptor is subjected to wavelet transformation, and multiple resolution analysis for separating into a plurality of frequency components from a high-frequency component to a low-frequency component is performed. Furthermore, a one-dimensional data array acquired by thinning the lowest frequency component acquired at that time is formed; wavelet transformation is performed also on the one-dimensional data array, and the multiple resolution analysis for separating into a plurality of frequency components from ahigh-frequency component to a low-frequency component is performed; and a ten-point average roughness and the maximum height are determined, relative to the acquired multiple resolution analysis result. COPYRIGHT: (C)2009,JPO&INPIT
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