| 摘要 |
PROBLEM TO BE SOLVED: To provide a technology for enabling the reliable clamping of a voltage level of a clamping object signal to be smaller than a threshold, regarding a clamping test device which clamps signal passing a prescribed region of a digital processing device. SOLUTION: A negative voltage generating part 11 generates a negative voltage which becomes necessary for clamping the voltage level of the clamping object signal by accumulating a charge in a capacitor. A relay switch control part 12 controls the connection/disconnection or the like of a relay switch which changes over the charge of the capacitor to the execution of clamping by the charged capacitor, and vice versa. A delay circuit 13 makes a delay for a time until the operation of the relay switch in the negative voltage generating part 11 is completed, and sends gate conditions to a clamping execution trigger generating part 14. The clamping execution trigger generating part 14 controls the timing of applying the negative voltage on the clamping object signal. COPYRIGHT: (C)2009,JPO&INPIT
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