发明名称 MONOMER, RESIST COMPOSITION, AND PATTERNING PROCESS
摘要 A pattern is formed by applying a positive resist composition comprising a polymer comprising hydroxyalkylnaphthalene-bearing recurring units and acid labile group-bearing recurring units onto a substrate to form a resist film, heat treating and exposing the resist film to radiation, heat treating and developing the resist film with a developer to form a first pattern, and causing the resist film to crosslink and cure with the aid of heat or of acid and heat. A second pattern is then formed in the space area of the first pattern. The double patterning process reduces the pitch between patterns to one half.
申请公布号 US2009226843(A1) 申请公布日期 2009.09.10
申请号 US20090398483 申请日期 2009.03.05
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 HATAKEYAMA JUN;KINSHO TAKESHI;OHASHI MASAKI;KATAYAMA KAZUHIRO
分类号 G03F7/20;C08F120/10;G03F7/004 主分类号 G03F7/20
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