发明名称 |
Verfahren zur Überwachung von Leistungshalbleiterbauelementen |
摘要 |
The circuit arrangement includes at least two electrically separated groups of contact areas (10) with the same functionality. The contact areas are provided on a power semiconductor. Each electrically separated group of contact areas are connected with the neutral point of a star connection (18) via an active and/or a passive component (17). All electrically separated groups of contact areas are connected with at least a further contact area (16) provided outside the power semiconductor. An Independent claim is also provided for a method for monitoring the circuit arrangement. |
申请公布号 |
DE50311749(D1) |
申请公布日期 |
2009.09.10 |
申请号 |
DE2003511749 |
申请日期 |
2003.10.15 |
申请人 |
SEMIKRON ELEKTRONIK GMBH & CO. KG |
发明人 |
HERZER, REINHRAD DR.;NETZEL, MARIO DR.;LEHMANN, JAN;PAWEL, SASCHA |
分类号 |
H01L25/07;G01R31/04;G01R31/27;G01R31/28;G01R31/316;H01L23/498;H01L23/544;H01L25/16 |
主分类号 |
H01L25/07 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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