发明名称 MEMORY FAULT PROCESSING SYSTEM, MEMORY FAULT PROCESSING METHOD, AND MEMORY FAULT PROCESSING PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To determine whether to continue or stop a process using a memory region according to the use of the process when the correctable defect of the memory occurs. <P>SOLUTION: To an entry registered in a TLB, "a defect frequency" and "a defect threshold " are added. The defect frequency holds the frequency of the correctable defect occurring in a corresponding physical address space. The defect threshold holds the maximum number of correctable defects permitted by the corresponding process. Also, a defect frequency monitoring mechanism connected to the TLB is provided with a function for comparing the defect frequency with the defect threshold, and when the defect frequency exceeds the defect threshold, issuing a signal to stop the process. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009205212(A) 申请公布日期 2009.09.10
申请号 JP20080043924 申请日期 2008.02.26
申请人 NEC CORP 发明人 KAWAGUCHI EIICHIRO
分类号 G06F12/16;G06F11/30;G06F12/08;G06F12/10 主分类号 G06F12/16
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