发明名称 |
SUBSTRATE TREATMENT APPARATUS, AND SUBSTRATE SUPPORT TO BE USED FOR THE APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a substrate treatment apparatus that performs an excellent etching treatment on a major surface of a substrate while preventing or suppressing stagnation of an etching liquid on the major surface of the substrate, and to provide a substrate support that prevents or suppresses the stagnation of the etching liquid on the major surface of the substrate. <P>SOLUTION: The substrate treatment apparatus 1 includes the substrate support 3 and a spin chuck 4 which rotates a wafer W and the substrate support 3. On an upper surface of the substrate support 3, a cylindrical storage recess 13 and a flat first annular surface 12 are formed. The first annular surface 12 is disposed closely to an upper surface of the wafer W held in the storage recess 13 so that nitrohydrofluoric acid on the first annular surface 12 and nitrohydrofluoric acid on the upper surface of the wafer W may form a continuous liquid film. The first annular surface 12 is subjected to sand blast processing (lyophilic processing). <P>COPYRIGHT: (C)2009,JPO&INPIT |
申请公布号 |
JP2009206485(A) |
申请公布日期 |
2009.09.10 |
申请号 |
JP20080307995 |
申请日期 |
2008.12.02 |
申请人 |
DAINIPPON SCREEN MFG CO LTD |
发明人 |
ARAI KENICHIRO;NADA KAZUNARI |
分类号 |
H01L21/306;B08B3/02;H01L21/304 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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