发明名称 RESIST PROTECTIVE FILM MATERIAL AND PATTERNING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a resist protective film material for forming a protective film on a photoresist film to protect the photoresist film in liquid immersion photolithography, and a patterning method using the material. <P>SOLUTION: The resist protective film material for forming the protective film on the photoresist film comprises at least a polymer compound I including a repeating unit (a) represented by a general formula (1), and a polymer compound II including a repeating unit having a sulfonic acid or an amine salt of a sulfonic acid. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009205132(A) 申请公布日期 2009.09.10
申请号 JP20080285563 申请日期 2008.11.06
申请人 SHIN ETSU CHEM CO LTD 发明人 HATAKEYAMA JUN;HARADA YUJI
分类号 G03F7/11;C08F20/24;G03F7/38;H01L21/027 主分类号 G03F7/11
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