发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To improve the throughput of a dicing stage. <P>SOLUTION: A dicing device comprises a prealignment section 11c provided with a prealignment camera 11d to recognize a mark formed on a multipiece substrate 7; a dicing section 11e which dices the multipiece substrate 7 based upon information acquired through image recognition by the prealignment section 11c; and an XY table 11k conveying the multipiece substrate 7. The prealignment section 11c previously recognize all marks on the multipiece substrate 7 through the image processing to find dicing places, and then the dicing section 11e speedily cut the multipiece substrate with a blade 10 only by recognizing only several places through the alignment camera 11g. Consequently, the prealignment and dicing can be performed in parallel in the dicing stage to improve the throughput of the dicing stage. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009206532(A) 申请公布日期 2009.09.10
申请号 JP20090145683 申请日期 2009.06.18
申请人 RENESAS TECHNOLOGY CORP;RENASAS NORTHERN JAPAN SEMICONDUCTOR INC 发明人 YAMAGUCHI YOSHIHIKO
分类号 H01L23/12;H01L23/00 主分类号 H01L23/12
代理机构 代理人
主权项
地址