发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device which uses a continuous oscillation laser device for improving characteristics of the semiconductor device. <P>SOLUTION: A semiconductor film is formed on a substrate and crystallized with a plurality of laser beams. The plurality of laser beams are made incident obliquely to the vertical direction of the substrate at the same angleϕof incidence to manufacture the semiconductor device having high performance. Especially, the semiconductor device with high performance is obtained by satisfyingϕ≥arcsin(W/2d), where W is the beam width and (d) is the thickness of the substrate. <P>COPYRIGHT: (C)2009,JPO&INPIT</p> |
申请公布号 |
JP2009206521(A) |
申请公布日期 |
2009.09.10 |
申请号 |
JP20090136617 |
申请日期 |
2009.06.05 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
TANAKA KOICHIRO;YAMAZAKI SHUNPEI |
分类号 |
H01L21/20;H01S5/06;B23K26/06;B23K26/067;B23K26/073;B23K26/10;G02F1/1368;H01L21/336;H01L29/786 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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