发明名称 X-RAY INSPECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide an X-ray inspection system for teaching necessary observation points and observation directions for inspecting an article without providing the article to be inspected and also improving workability in the teaching work. SOLUTION: The X-ray inspection system displays the three-dimensional model M of an object to be inspected, based on three-dimensional information and dimension information of the object to be input and installation location information to a sample stage 13; stores a plurality of observation points, observation directions, and observation magnification when the object is observed on the three-dimensional model M, which are sequentially set; and moves the sample stage 13 and the relative position between an X-ray generator 11 and an X-ray detector so as to obtain the observation points, the observation directions, and the observation magnification according to the sequence set when an actual object is observed. Setting with the display of the three-dimensional model based on 3D CAD data allows one to easily grasp the observation points and the observation directions of the object without providing the object and to achieve facilitation and efficiency of the teaching work. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009204503(A) 申请公布日期 2009.09.10
申请号 JP20080048019 申请日期 2008.02.28
申请人 SHIMADZU CORP 发明人 KOJIMA TAKUMA
分类号 G01N23/04 主分类号 G01N23/04
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