| 摘要 |
A method for inspecting an organic electro luminescence device is provided to decide a failure easily by recognizing the open failure of an organic electro luminescence device through a leak current measured during aging. A first electrode(20), an organic film(30) and a second electrode(40) are laminated in sequence. The organic film includes a luminance layer, and the second electrode has the thickness over 135nm. The voltage is applied between first and second electrodes, and the leak current flowing between the both electrodes is measured. Based on the measured leak current, the defection of an organic EL device(100) is decided. |
