CONTROL METHOD FOR PROGRAMABLE POWER CONTROL UNIT AND TEST SYSTEM FOR SEMICONDUCTOR

摘要

A control method for a programmable power control unit and a test system for a semiconductor are provided to vary power supplied to semiconductor to be tested by controlling a programmable power supply unit through an interface converter. In a control method for a programmable power control unit and a test system for a semiconductor, it is determined whether a power supply unit is connected with an interface converter or not(S40). If a power supply unit is connected with the interface converter, a parameter for communicating the interface converter is determined(S50). A control signal for varying the power supplied to under test semiconductor is transmitted to the interface converter based on the predetermined parameter(S60).