| 摘要 |
<p>A terahertz spectrometer is provided to improve the measurement precision of a sample and detect reflected terahertz wave by inducing the reflected terahertz to a terahertz wave detecting element with an ellipsoidal mirror. A terahertz spectrometer comprises a terahertz wave origination element, an ellipsoidal mirror(32), an optical lens, and a terahertz wave detecting element. The optical lens irradiates the terahertz wave generated in a terahertz wave generating element on the focal plane of the first focal point which the ellipsoidal mirror has in an oblique direction. The terahertz wave detecting element is arranged in the second focus of the ellipsoidal mirror. The terahertz wave generating element, the optical lens and the terahertz wave detecting element are arranged at the one domain as boundary which is vertical plane against the focal plane passing through the first focal point. The ellipsoidal mirror is arranged at the other domain as boundary which is vertical plane against the focal plane passing through the first focal point.</p> |
