发明名称
摘要 <p>A phase shift photomask is constructed by forming a phase shifter defining a second light transmissive region on a substrate transmissive to exposure light. Exposure light undergoes multiple reflection within the phase shifter. This enables use of a thinner shifter film, minimizes a phase variation relative to a film thickness variation, and alleviates optical restraints on the film.</p>
申请公布号 JP4328922(B2) 申请公布日期 2009.09.09
申请号 JP19990266597 申请日期 1999.09.21
申请人 发明人
分类号 H01L21/027;G03F1/26;G03F1/30;G03F1/32;G03F1/52;G03F1/68 主分类号 H01L21/027
代理机构 代理人
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