发明名称 METHOD FOR FABRICATING PHOTOMASK
摘要 <p>A method for fabricating a photo-mask is provided to increase the margin of an entire exposure process by forming an oxidation film partially on the cell edge portion. A first patter(110) is formed on a mask substrate(100) including a cell region and a peripheral region, and an oxidation film(120) having uniform thickness is formed on the material on which a first pattern. The oxidation film of the exposed cell region is removed through an etching process. The first pattern is a light-blocking pattern and a phase sift layer pattern.</p>
申请公布号 KR20090095387(A) 申请公布日期 2009.09.09
申请号 KR20080020693 申请日期 2008.03.05
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JEON, JIN HYUCK
分类号 H01L21/027 主分类号 H01L21/027
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