发明名称 Semiconductor device and method of manufacturing the same
摘要 A MOS transistor includes a substrate, source/drain regions formed at portions of the substrate, and a channel region formed between the source/drain regions. The MOS transistor further includes a gate structure having a gate insulation layer pattern and a gate electrode formed on the channel region. The gate electrode includes a first gate conductive layer pattern and a second gate conductive layer pattern. The first gate conductive layer pattern has a nitrogen concentration gradient gradually increasing from a lower portion of the first gate conductive layer pattern to an upper portion of the first gate conductive layer pattern. The second gate conductive layer pattern includes a material having a resistance substantially lower than a resistance of the first gate conductive layer pattern.
申请公布号 US7585756(B2) 申请公布日期 2009.09.08
申请号 US20070839387 申请日期 2007.08.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 NAM GAB-JIN;LEE MYOUNG-BUM
分类号 H01L21/3205 主分类号 H01L21/3205
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