发明名称 |
Semiconductor device and method of manufacturing the same |
摘要 |
A MOS transistor includes a substrate, source/drain regions formed at portions of the substrate, and a channel region formed between the source/drain regions. The MOS transistor further includes a gate structure having a gate insulation layer pattern and a gate electrode formed on the channel region. The gate electrode includes a first gate conductive layer pattern and a second gate conductive layer pattern. The first gate conductive layer pattern has a nitrogen concentration gradient gradually increasing from a lower portion of the first gate conductive layer pattern to an upper portion of the first gate conductive layer pattern. The second gate conductive layer pattern includes a material having a resistance substantially lower than a resistance of the first gate conductive layer pattern.
|
申请公布号 |
US7585756(B2) |
申请公布日期 |
2009.09.08 |
申请号 |
US20070839387 |
申请日期 |
2007.08.15 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
NAM GAB-JIN;LEE MYOUNG-BUM |
分类号 |
H01L21/3205 |
主分类号 |
H01L21/3205 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|