发明名称 Semiconductor device and method of fabricating the same
摘要 An extension region is formed by ion implantation under masking by a gate electrode, and then a substance having a diffusion suppressive function over an impurity contained in a source-and-drain is implanted under masking by the gate electrode and a first sidewall spacer so as to form amorphous layers a semiconductor substrate within a surficial layer thereof and in alignment with the first sidewall spacer, to thereby form an amorphous diffusion suppressive region.
申请公布号 US7585739(B2) 申请公布日期 2009.09.08
申请号 US20070984737 申请日期 2007.11.21
申请人 FUJITSU MICROELECTRONICS LIMITED 发明人 SAIKI TAKASHI;OHTA HIROYUKI;KANATA HIROYUKI
分类号 H01L21/336;H01L21/265;H01L21/8238;H01L27/092;H01L29/78 主分类号 H01L21/336
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