发明名称 Apparatus and method to confine plasma and reduce flow resistance in a plasma reactor
摘要 An apparatus configured to confine a plasma within a processing region in a plasma processing chamber. In one embodiment, the apparatus includes a ring that has a baffle having a plurality of slots and a plurality of fingers. Each slot is configured to have a width less than the thickness of a plasma sheath contained in the processing region.
申请公布号 US7585384(B2) 申请公布日期 2009.09.08
申请号 US20080201156 申请日期 2008.08.29
申请人 APPLIED MATERIALS, INC. 发明人 BERA KALLOL;YE YAN;CARDUCCI JAMES D.;HOFFMAN DANIEL J.;SHANNON STEVEN C.;BUCHBERGER, JR. DOUGLAS A.
分类号 H01L21/3065;C23C16/00;H01J37/32;H01L21/306 主分类号 H01L21/3065
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