Test pattern generation in residue networks

摘要

Generating a near-minimal test pattern set for overlapping residue circuit trees in a residue network includes resolving a residue function of residue circuits through the network and making note of any gate at which the residue function thereof does not produce the assigned vector output for a given assigned set of input vectors. Where such gates cannot be resolved during one set of vector assignments, the test set that is complete up to the offending gate may be saved, and resolution of the residue function may be started from another node in the network. Multiple test sets may be generated, the combined application of which will exhaustively test each gate in the network.