发明名称 SEMICONDUCTOR AND FABRICATING METHOD THEREOF
摘要 A semiconductor and a manufacturing method thereof are provided to prevent a leakage current generated in the metal wire by forming a vacuum cavity or an air layer instead of a protective layer of an electrode pad. A substrate(200) includes at least one electrode pad(210). A sacrificial layer is formed on the substrate contacting the electrode pad partially. A rearrangement conductive layer(230) is formed on a part of the electrode pad and the upper part of the sacrificial layer. The sacrificial layer is removed. The substrate and the rearrangement conductive layer are partially non-contacted.
申请公布号 KR100915761(B1) 申请公布日期 2009.09.04
申请号 KR20070075582 申请日期 2007.07.27
申请人 发明人
分类号 H01L21/60;H01L23/48 主分类号 H01L21/60
代理机构 代理人
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