| 摘要 |
A three-dimensional measuring apparatus, method, and program for acquiring many pieces of information on a pattern of light by a single projection and highly accurate three-dimensional information at high speed. The three-dimensional measuring apparatus comprises a pattern projector serving as projecting means for projecting a pattern of light onto a measurement object, a camera serving as imaging means for capturing an image of the measurement object illuminated with the pattern of light, and a computer for processing data on the image captured by the camera. The computer computes the direction angle of each individual pattern of light which forms the projected pattern of light from the intensity value of the projected pattern of light detected from the captured image, divides the intensity distribution, and computes the depth distance from the phase value at each measuring point of the divided pattern. Thus, highly accurate three-dimensional information is acquired.
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