THE SYSTEM AND ITS METHOD FOR MEASURING THE RF CHARACTERISTICS OF RFID SYSTEM

摘要

An apparatus for measuring the RF characteristic of an RFID system and a method thereof are provided to increase the measurer's convenience and measurement reliability. A signal generator(3) transmits a generated RF signal into an electronic wave non-reflective room(1) through a transceiving antenna. A receiving antenna(5) for a measuring equipment is installed in a place where the influence of electronic wave property of a measurement target device(4) cannot reach. A measuring equipment(6) measures and analyzes the RF signal, received from the measurement target device, through the receiving antenna.