INSPECTION APPARATUS

摘要

An inspection apparatus is provided to determine the defect due to contact or panel when the lighting is failed when inspecting the lighting. A plurality of probe assemblies(6) have a probe which directly contacts with a electrode of an object board. A probe base(5) supports each probe assembly. A plurality of probe assemblies are comprised of a probe assembly(6A) for a full contact and the probe assembly(6B) for the simple contact. The probe assembly for the simple contact includes a moving device for moving the probe to the object board.