| 摘要 |
PROBLEM TO BE SOLVED: To provide a component testing device capable of improving throughput on a test of an electronic component by shortening a time followed by exchange of the electronic component into a test socket. SOLUTION: This component testing device has two conveyance hands 50A, 50B for conveying the electronic component T to a component test part. Each conveyance hand 50A, 50B can be moved independently in the horizontal direction, and on each conveyance hand 50A, 50B, index units 60A, 60B, 60C which are movable independently in the vertical direction are arranged adjacently in the moving direction of the conveyance hands 50A, 50B. Exchange of the electronic component T into the test socket Sc is performed continuously based on each individual successive movement of the conveyance hands 50A, 50B and the index units 60A, 60B, 60C. COPYRIGHT: (C)2009,JPO&INPIT
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