| 摘要 |
PROBLEM TO BE SOLVED: To provide a serial signal generating apparatus for generating a series signal capable of testing a receiving device in an actual operation frequency, and to provide a device-testing apparatus capable of performing efficiently various tests of the receiving device by using the series signal. SOLUTION: The device testing apparatus 1 is equipped with a testing apparatus body 10 of the widely-used testing apparatus for testing the device, and the serial signal generating apparatus 20 for generating the series signal, and performs a test of a DUT 40 which is the receiving device. The serial signal generation apparatus 20 is equipped with a transmission control part 22 for storing test data D1 which are outputted from the testing apparatus body 10, and a transmission module 23 for converting the test data D1, read out from the transmission control part 22 in synchronism with a clock signal CK2 outputted from a jitter reducting part 21 into a series signal, having data transfer speed corresponding to a frequency of the clock signal CK2 and the number of bits of the test data D1. COPYRIGHT: (C)2009,JPO&INPIT
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