发明名称 Specimen analyzer, abnormality control method of the same and computer program product
摘要 Specimen analyzer includes a first holding section for holding a container; a first mechanism section for executing a first operation for the container on the first holding section; a second holding section for holding the container; a first transfer mechanism section for transferring the container from the first holding section to the second one; a second mechanism section for executing a second operation for the container on the second one; an error detector for detecting error in the first mechanism section; and an error controller for controlling the operation of the first holding section, the first and second operation so that the first operation and the transfer operation of the first holding section would be stopped while the second operation would be continued in case of the error in the first mechanism section. An abnormality control method of the analyzer and computer program product are also disclosed.
申请公布号 US2009215183(A1) 申请公布日期 2009.08.27
申请号 US20080288555 申请日期 2008.10.21
申请人 SYSMEX CORPORATION 发明人 TAKEHARA HISATO;WAKAMIYA YUJI;NISHIDA TOMOYUKI
分类号 G01N35/02 主分类号 G01N35/02
代理机构 代理人
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