<p>Provided is a test device which can significantly reduce the time required for testing a solid state imaging device. The test device includes: a first tray (2) having a plurality of containers having a gap penetrating through an insert direction of an object to be contained; a test chart (10) which can be imaged by camera modules (3) contained in the respective containers; a contactor (7) which can be brought into contact with an electrode formed on the rear surface opposite to the main surface of the camera modules (3) opposing to the test chart (10); and an inspection unit (20) which can analyze an imaging result given from the camera modules (3) via the contactor (7). In the state that a plurality of camera modules (3) are contained in the respective containers, at least one test chart (10) can be set within the range of the field of view of the camera modules (3).</p>
