发明名称 Method for testing functional capability of embedded component in embedded system, involves connecting two embedded components for data exchange by bus
摘要 <p>The method involves connecting two embedded components (2,3) for data exchange by a bus. Another embedded component and a produced output of a message packet of the bus are simulated by simulation program sections (4,5) of the simulation program. The functional capability of the embedded component is determined by comparing the time response of produced signals against a predetermined time response. An independent claim is included for a data medium with a simulation program for the execution of the method.</p>
申请公布号 DE102008010600(A1) 申请公布日期 2009.08.27
申请号 DE20081010600 申请日期 2008.02.22
申请人 INCHRON GMBH 发明人 DOERFEL, MATTHIAS;MUENZENBERGER, RALF;WUELAND, HELMAR
分类号 G05B23/02;G05B17/02 主分类号 G05B23/02
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