发明名称 PLASMA PROCESSING APPARATUS, PLASMA PROCESSING METHOD AND STORAGE MEDIUM
摘要 <p>Disclosed is a plasma processing apparatus wherein good temperature controllability is obtained in the side wall of the processing vessel and damage to the substrate by plasma is suppressed. Specifically disclosed is a plasma processing apparatus (1) comprising a first electrode (31) and a second electrode (32) so arranged in the upper portion of a processing vessel (11) as to face a stage (2), a gas supplying unit (4) for supplying a process gas between the first electrode (31) and the second electrode (32), a high-frequency power supply unit (33) for applying a high-frequency power between the first electrode (31) and the second electrode (32) for changing the process gas supplied between the electrodes (31, 32) into a plasma, and an evacuation system (14) for vacuum evacuating the atmosphere within the processing vessel (11) from the lower portion of the processing vessel (11). Since the electron temperature in the plasma is low near a substrate B on the stage (2), damage to the substrate B caused by the plasma can be suppressed. In addition, since a metal can be used as a material for the processing vessel (11), the processing vessel (11) can have good temperature controllability. ® KIPO & WIPO 2009</p>
申请公布号 KR20090091332(A) 申请公布日期 2009.08.27
申请号 KR20097014829 申请日期 2007.12.27
申请人 TOKYO ELECTRON LIMITED 发明人 SAWADA IKUO;VENTZEK PETER;OSHITA TATSURO;MAZUZAKI KAZUYOSHI;KANG, SONG YUN
分类号 H05H1/46;H01L21/205;H01L21/3065 主分类号 H05H1/46
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