| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection device capable of obtaining stable results by automatizing the inspection process including organoleptic tests. SOLUTION: The inspection device makes improvement to the inspection device to inspect a waveform measuring device. The waveform measuring device comprises a waveform measuring section for measuring an input signal and forming a waveform image, and an analyzing means for determining a plurality of values showing waveform quality from the waveform image measured with the waveform measuring section. The present inspection device comprises a waveform output section for outputting a signal to the waveform measuring device according to a control signal, a set value storage section for storing a set value of the control signal and the value of the waveform quality at this set value, a power source for outputting the control signal to the waveform output section based on the set value of the set value storage section, and a determining means for determining the pass-fail of the waveform measuring device by comparing the value determined with the analyzing means of the waveform measuring device with the value of the waveform quality of the set value storage section. COPYRIGHT: (C)2009,JPO&INPIT
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