发明名称 DEVICES INCLUDING FIN TRANSISTORS ROBUST TO GATE SHORTS AND METHODS OF MAKING THE SAME
摘要 Disclosed are methods, systems and devices, including a method that includes the acts of etching an inter-row trench (144, 220) in a substrate (102, 210), substantially or entirely filling the inter-row trench (144, 220) with a dielectric material (150, 222), and forming a fin (190, 258) and an insulating projection (168, 242) at least in part by etching a gate trench (164, 238) in the substrate (102, 210). In some embodiments, the insulating projection (168, 242) includes at least some of the dielectric material (150, 222) in the inter-row trench (144, 220).
申请公布号 WO2009105317(A1) 申请公布日期 2009.08.27
申请号 WO2009US32357 申请日期 2009.01.29
申请人 MICRON TECHNOLOGY, INC.;JUENGLING, WERNER 发明人 JUENGLING, WERNER
分类号 H01L21/336;H01L21/8242;H01L29/78 主分类号 H01L21/336
代理机构 代理人
主权项
地址
您可能感兴趣的专利