发明名称 PARTICULATE MEASURING DEVICE, AND ELECTRODE USED THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a particulate measuring device which is reduced in cost by simplifying an electrode structure that induces nonuniformity in the electric field, and to provide an electrode which is used for the device. SOLUTION: In a microbe measuring device, a chamber 1 is constituted by disposing the electrodes 33 and 34 between substrates 31 and 32 and a structure 35 for generating electric field distortions on one electrode 34. A sample inlet 37 is disposed at one end of a chamber 1, and an outflow port 38 is formed at the other end. The chamber 1 is filled with suspension, the electrodes 33 and 34 are connected to a migration power supply section 4, and the electric field is applied. Thus, the structure 35 is arranged between the pair of electrodes 33 and 34 and induces nonuniformity in the electric field so that the structure of the electrodes 33 and 34 for making dielectrophoresis force acting on the particulates in the suspension is simplified and cost of the particulate measuring device can be lowered. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009192479(A) 申请公布日期 2009.08.27
申请号 JP20080036045 申请日期 2008.02.18
申请人 PANASONIC CORP 发明人 HAMADA SATORU
分类号 G01N15/10;C12M1/34 主分类号 G01N15/10
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