发明名称 ELECTRON BEAM WRITING METHOD, FINE PATTERN WRITING SYSTEM, METHOD FOR MANUFACTURING UNEVEN PATTERN CARRYING SUBSTRATE, AND METHOD FOR MANUFACTURING MAGNETIC DISK MEDIUM
摘要 When performing writing on a substrate applied with a resist by rapidly vibrating electron beam in a direction orthogonal to a radial direction of the substrate and X-Y deflecting the electron beam while rotating the substrate in one direction, a long element is written by scanning the electron beam with the middle position of a 2-bit signal length as the center position of the electron beam so as to completely fill the area of the writing length reduced by a predetermined ratio and an unwritten portion of predetermined width remaining on each side of the long element with respect to a final 2-bit signal length on a magnetic disk medium.
申请公布号 US2009212230(A1) 申请公布日期 2009.08.27
申请号 US20090393117 申请日期 2009.02.26
申请人 FUJIFILM CORPORATION 发明人 USA TOSHIHIRO;KOMATSU KAZUNORI
分类号 H01J3/14;G01Q10/04 主分类号 H01J3/14
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