发明名称 |
METHOD FOR LOCALISED HETERO-EPITAXY ON A DIELECTRIC, IN PARTICULAR GERMANIUM ON SILICON OXIDE, AND METHOD AND SYSTEM FOR MAKING A PRODUCTION BASE OF A HOMOGENEOUS OR HETEROGENEOUS INTEGRATED CIRCUIT |
摘要 |
The invention relates to method for making, by localised hetero-epitaxy, a layer of a semiconductor i.e. of germanium, by lateral growth on the surface of an insulating material covering a semiconductor substrate. The invention also relates to the creation of a production base, or wafer, of a homogeneous or heterogeneous integrated circuit on germanium, and to a system for making such bases. The method comprises: a spatially selective etching producing a composite surface layer including a first material (106, 206) in a first region and a second material (104, 204), wherein the regions are contiguous at least at an interface area (1070, 2070) with a level difference between said first region and said second region; a chemical etching (128, 225) of the first material until a portion (107, 207) of the substrate is exposed in the vicinity of said interface; and the growth (129, 130) of said semiconductor (109, 110) from the exposed so-called germination area (107).
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申请公布号 |
WO2009081015(A4) |
申请公布日期 |
2009.08.27 |
申请号 |
WO2008FR52304 |
申请日期 |
2008.12.15 |
申请人 |
UNIVERSITE PARIS SUD;CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE;BOUCHIER, DANIEL;YAM, VY;CAMMILLERI, VINCENZO DAVIDE;FOSSARD, FREDERIC;RENARD, CHARLES |
发明人 |
BOUCHIER, DANIEL;YAM, VY;CAMMILLERI, VINCENZO DAVIDE;FOSSARD, FREDERIC;RENARD, CHARLES |
分类号 |
H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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