发明名称 HIGH PRECISION WAVELENGTH MEASUREMENT AND CONTRL OF A TUNABLE LASER
摘要 A tunable laser wavelength measurement system includes an interferometric wavelength tracking system that uses a combination of interferometric and wavelength reference measurements to directly measure the laser output wavelength, The measurement exhibits the following desirable error signal characteristics: directional information, continuity, low latency, absolute information, high accuracy, high precision, and little or no drift, A tunable laser wavelength control system additionally incorporates electronics to compare the measured laser wavelength to a desired wavelength or wavelength function, and to generate a feedback control signal to control the wavelength of the laser output based on the comparison. In one non-limiting example implementation, the desired wavelength function is repetitive. The difference between the desired wavelength function and the interferometrically-measured wavelength function is taken, and a successive approximation technique is employed to calculate and adjust a repetitive controlling signal to obtain the desired wavelength function.
申请公布号 WO2009105633(A2) 申请公布日期 2009.08.27
申请号 WO2009US34664 申请日期 2009.02.20
申请人 LUNA INNOVATIONS INCORPORATED;SEELEY, RYAN;FROGGATT, MARK, E. 发明人 SEELEY, RYAN;FROGGATT, MARK, E.
分类号 G01J1/42;G01J1/18 主分类号 G01J1/42
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