| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To maintain the high productivity of chip-type resistance units by simply and efficiently determining defects in a chip resistor substrate. <P>SOLUTION: A device 2 executes the quality determination of a chip resistor substrate 1 including a plurality of chip resistors after trimming each chip resistor. The device 2 is provided with an image pickup means 4 for imaging images of the chip resistors, an image processing means 5 for processing the images imaged by the image pickup means 4, a first storage means 6 for storing image data related to the images, a second storage means 6 for storing defect data related to a plurality of defective patterns in pre-prepared chip resistors, and a detection means 6 for detecting defects in the chip resistor substrate by comparing the image data and the defect data. <P>COPYRIGHT: (C)2009,JPO&INPIT</p> |
