发明名称 DISPLAY AND DEFECT DETECTING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a display and a defect detecting method in which a pixel defect generated in a pixel is easily detected. SOLUTION: The display 1 includes: a display panel 2 having a plurality of gate lines 22 and a gate line 22A for inspection crossing a source line 23 at right angles; a source driving control unit 3; a gate driving control unit 4; and an inspection circuit 5 which outputs electric charges held by respective pixels for inspection of the gate line 22A for inspection to a detection terminal to which a detecting means can be connected. Then, the display 1 includes: a source conduction control means 110 of controlling a conduction state of a current to the source line 23; a charging control means 120 of making a pixel to be inspected hold electric charges in a state wherein the current is allowed to flow to the source line 23; a charge movement control means 130 of moving electric charges from the pixel to be inspected to the pixels for inspection in a state wherein the current to the source line 23 is blocked; and an inspection charge output control means 140 of outputting the electric charges held by the pixels for inspection to the detection terminal in sequence. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009192909(A) 申请公布日期 2009.08.27
申请号 JP20080034520 申请日期 2008.02.15
申请人 SEIKO EPSON CORP 发明人 MAEDA AKITOSHI
分类号 G09G3/36;G01R31/00;G02F1/133;G09F9/00;G09F9/30;G09G3/20 主分类号 G09G3/36
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