发明名称 STUD STRUCTURE FOR AN IMAGE SENSOR ON A THINNED SUBSTRATE
摘要 The invention relates to the fabrication of electronic circuits on a thinned semiconductor substrate. To produce a connection pad on the back side of the thinned substrate, the procedure is as follows: an integrated circuit is produced on an unthinned substrate, in which a portion of a polycrystalline silicon layer (18) dedicated for the connection of the pad is provided. The circuit is transferred onto a transfer substrate (30) and then its back side is thinned. A via is opened in the thinned semiconductor layer (12) in order to gain access to the polycrystalline silicon; aluminum (80) is deposited and this layer is etched so as to define a pad which is in contact with the internal interconnects of the integrated circuit by way of the polycrystalline silicon.
申请公布号 EP2092564(A1) 申请公布日期 2009.08.26
申请号 EP20070857381 申请日期 2007.12.11
申请人 E2V SEMICONDUCTORS 发明人 BLANCHARD, PIERRE
分类号 H01L27/146 主分类号 H01L27/146
代理机构 代理人
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