发明名称 |
Image pick up device for measuring invariants such as contrast and method of performing such a measurement |
摘要 |
<p>The sensor has a pixel array (10) receiving a light beam representing a visual scene, and a comparator (30) determining a moment at which a voltage (Vp) reaches a reference voltage (Vref). A counting device counts a number of periods of clock elapsed from beginning of an integration phase and provides a result in the form of a binary code, where the period of clock increases proportionally to the time elapsed from the beginning of the integration phase. A controlling unit controls a termination of the integration phase, and a reading unit reads information stored in a static RAM (50). An independent claim is also included for a method for measuring a local contrast proper to a scene.</p> |
申请公布号 |
EP2093996(A1) |
申请公布日期 |
2009.08.26 |
申请号 |
EP20080151781 |
申请日期 |
2008.02.22 |
申请人 |
CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE SA - RECHERCHE ET DEVELOPPEMENT |
发明人 |
HEIM, PASCAL;RUEDI, PIERRE-FRANCOIS |
分类号 |
H04N5/355;H04N5/3745;H04N5/378 |
主分类号 |
H04N5/355 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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