| 摘要 |
A probe card for testing semiconductor devices is provided to control the flatness of a printed circuit board and a frame by pushing and pulling a frame along leveling bolt. A plurality of probes is installed at the lower part of a frame(110), and a printed circuit board(120) is connected with the probe. A reinforcement plate(130) is positioned on the printed circuit board, and a support projection(144) is formed so that a plurality of leveling bolts(140) support the upper end of the frame. A plurality of stop members(150) supports the frame in order to adhere closely to the reinforcement plate with the printed circuit board.
|
