发明名称 |
CHEMICAL MECHANICAL POLISHING PAD |
摘要 |
<p>A chemical mechanical polishing pad is provided to reduce the scratch generated from a polished surface by having an inclined surface on a polishing surface. A chemical mechanical polishing pad comprises a polishing surface(20), a non-polishing surface(22), a side and a plurality of grooves. The non-polishing surface is formed at the opposite side to the polishing surface. The side connects the outer side of the polishing surface with the outer side of the non-polishing surface. The grooves are installed on the polishing surface. The side has an inclined surface connected with the polishing surface. The depth of a groove is the same as the height of the inclined surface or less.</p> |
申请公布号 |
KR20090089263(A) |
申请公布日期 |
2009.08.21 |
申请号 |
KR20090012810 |
申请日期 |
2009.02.17 |
申请人 |
JSR CORPORATION |
发明人 |
MOTONARI MASAYUKI;UENO TOMIKAZU;YAMAMOTO MASAHIRO;TAI YUUGO;MIYAUCHI HIROYUKI |
分类号 |
B24B37/20;B24B37/26;B24D3/00;H01L21/304 |
主分类号 |
B24B37/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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