发明名称 POLISHING PAD GRINDING RING, AND WAFER POLISHING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing pad grinding ring improving grinding efficiency during grinding of a surface layer portion of a polishing pad. <P>SOLUTION: The polishing pad grinding ring 160 is used for a wafer polishing device in order to grind the surface layer portion of the polishing pad. The grinding ring has: an annular ring body 161; a gear section 162 provided at an outer peripheral edge of the ring body 161 to mesh with a planetary gear mechanism; a grinding inner hole 163 formed inside the ring body 161; and grinding grooves 164 formed from the inner hole 163 to the gear section 162. The inner hole 163 has a circular opening with its center 03 located at a position different from the center 04 of an outer circumferential circle R of the ring body 161. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009184054(A) 申请公布日期 2009.08.20
申请号 JP20080025011 申请日期 2008.02.05
申请人 SEIKO INSTRUMENTS INC 发明人 FUJIHIRA YOICHI
分类号 B24B53/017;B24B53/02;B24B53/12;H03H3/02 主分类号 B24B53/017
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