发明名称 MEASURING APPARATUS, TEST APPARATUS, RECORDING MEDIUM, PROGRAM AND ELECTRONIC DEVICE
摘要 There is provided a measuring apparatus for measuring a signal-to-noise ratio of a discrete waveform which is output from an AD converter in response to an input signal, where the signal-to-noise ratio indicates a ratio of a signal component of the input signal to noise generated by the AD converter. The measuring apparatus includes a spectrum compensating section that receives a spectrum of the discrete waveform output from the AD converter, and compensates the received spectrum in accordance with a non-symmetric sideband between an upper sideband and a lower sideband of the received spectrum, where the upper and lower sidebands are defined with respect to a fundamental frequency of the input signal, and a phase noise waveform calculating section that calculates a phase noise waveform of the discrete waveform based on the spectrum which has been compensated by the spectrum compensating section.
申请公布号 US2009207897(A1) 申请公布日期 2009.08.20
申请号 US20080030879 申请日期 2008.02.14
申请人 ADVANTEST CORPORATION 发明人 YAMAGUCHI TAKAHIRO;KAWABATA MASAYUKI;SOMA MANI;ISHIDA MASAHIRO
分类号 H04B17/00 主分类号 H04B17/00
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