发明名称 METHOD FOR FABRICATING A GALLIUM NITRIDE PATTERN AND METHOD FOR FABRICATING FLASH MEMORY DEVICE AND FLASH MEMORY DEVICE USING THEREOF
摘要 <p>A method for manufacturing a GaN pattern, a flash memory device using the same, and a manufacturing method thereof are provided to manufacture a flash memory device of a micro type by using a nano rod arranged vertically with a substrate as a charge trapping layer. A substrate in which a tunneling insulation film is formed is loaded(S610). A GaN nano rod is formed on the substrate(S620). A gate insulation film is formed on the substrate in order to cover the GaN nano rod and the substrate(S630). A source region and a drain region are formed on the substrate of a bottom part of both sides of the tunneling insulation film(S640). A gate electrode, a source electrode, and a drain electrode are formed on the gate insulation film, the source region, and the drain region(S650).</p>
申请公布号 KR20090088505(A) 申请公布日期 2009.08.20
申请号 KR20080013811 申请日期 2008.02.15
申请人 IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) 发明人 KIM, TAE WHAN;KWON, YOUNG HAE;LEE, DEA UK;JUNG, JAE HUN
分类号 H01L21/20;H01L21/8247;H01L27/115 主分类号 H01L21/20
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