发明名称 |
METHOD FOR FABRICATING A GALLIUM NITRIDE PATTERN AND METHOD FOR FABRICATING FLASH MEMORY DEVICE AND FLASH MEMORY DEVICE USING THEREOF |
摘要 |
<p>A method for manufacturing a GaN pattern, a flash memory device using the same, and a manufacturing method thereof are provided to manufacture a flash memory device of a micro type by using a nano rod arranged vertically with a substrate as a charge trapping layer. A substrate in which a tunneling insulation film is formed is loaded(S610). A GaN nano rod is formed on the substrate(S620). A gate insulation film is formed on the substrate in order to cover the GaN nano rod and the substrate(S630). A source region and a drain region are formed on the substrate of a bottom part of both sides of the tunneling insulation film(S640). A gate electrode, a source electrode, and a drain electrode are formed on the gate insulation film, the source region, and the drain region(S650).</p> |
申请公布号 |
KR20090088505(A) |
申请公布日期 |
2009.08.20 |
申请号 |
KR20080013811 |
申请日期 |
2008.02.15 |
申请人 |
IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) |
发明人 |
KIM, TAE WHAN;KWON, YOUNG HAE;LEE, DEA UK;JUNG, JAE HUN |
分类号 |
H01L21/20;H01L21/8247;H01L27/115 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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