发明名称 X-RAY DETECTOR FOR PHASE CONTRAST IMAGING
摘要 The invention relates to an X-ray detector (30) that comprises an array of sensitive elements (Pi-1,b, Pia, Pib, Pi+1,a, Pi+1,b) and at least two analyzer gratings (G2a, G2b) disposed with different phase and/or periodicity in front of two different sensitive elements. Preferably, the sensitive elements are organized in macro-pixels (IIi) of e.g. four adjacent sensitive elements, wherein analyzer gratings with mutually different phases are disposed in front said sensitive elements. The detector (30) can particularly be applied in an X-ray device (100) for generating phase contrast images because it allows to sample an intensity pattern (I) generated by such a device simultaneously at different positions.
申请公布号 WO2009101569(A2) 申请公布日期 2009.08.20
申请号 WO2009IB50519 申请日期 2009.02.09
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;PHILIPS INTELLECTUAL PROPERTY & STANDARDS GMBH;BAEUMER, CHRISTIAN;ENGEL, KLAUS, J.;HERRMANN, CHRISTOPH 发明人 BAEUMER, CHRISTIAN;ENGEL, KLAUS, J.;HERRMANN, CHRISTOPH
分类号 主分类号
代理机构 代理人
主权项
地址