发明名称 METHOD FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for manufacturing a silicon carbide semiconductor device, capable of raising adhesiveness between an electrode and wiring when forming the wiring. SOLUTION: The method for manufacturing silicon carbide semiconductor device 100a includes: a process for preparing a silicon carbide semiconductor layer 110; a process for forming a metallic layer on the surface of the silicon carbide semiconductor layer 110; a process for forming the electrode 150 by thermally processing the metallic layer; and a process for performing etching to remove carbon on the surface of the electrode 150. In the process for forming the metallic layer, the metallic layer is formed, which is more reactive with silicon than carbon at temperature to thermally process the metallic layer. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009188100(A) 申请公布日期 2009.08.20
申请号 JP20080025175 申请日期 2008.02.05
申请人 SUMITOMO ELECTRIC IND LTD 发明人 TAMASO HIDETO
分类号 H01L21/28;H01L21/329;H01L21/337;H01L21/768;H01L29/417;H01L29/78;H01L29/808;H01L29/861 主分类号 H01L21/28
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