发明名称 ELECTRON BEAM DRAWING METHOD AND ELECTRON BEAM DRAWING DEVICE
摘要 PROBLEM TO BE SOLVED: To draw a fine pattern over a wide drawing range at a high speed with high accuracy. SOLUTION: A dot is formed by exposing a region in a cell on a substrate by relatively stopping an incident position of an electron beam incident to a moving substrate by deflecting the electron beam. When a dot is not to be formed in the cell, the electron beam is deflected at a high speed so as to move the incident position of the electron beam at a high speed with respect to the substrate. Accordingly, as projection of the electron beam onto the cell can be turned on and off without blanking the electron beam, a pattern can be drawn on the substrate at a high speed. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009186628(A) 申请公布日期 2009.08.20
申请号 JP20080024755 申请日期 2008.02.05
申请人 RICOH CO LTD 发明人 FUJIWARA YASUHIDE;WATABE TOSHIO
分类号 G03F7/20;G11B5/84;G11B7/26;H01L21/027 主分类号 G03F7/20
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