发明名称 |
COMPOSITION FOR POSITIVE PHOTOSENSITIVE RESIN, METHOD OF FORMING PATTERN AND SEMICONDUCTOR DEVICE |
摘要 |
<p>A positive photosensitive resin composition is provided to ensure high-sensitivity, excellent coating uniformity and resolution, and to minimize scum generation and shrinkage in crosslinkage. A positive photosensitive resin composition comprises a polyamide derivative 100.0 parts by weight; a photosensitive compound 5 -30 parts by weight; at least additive 0.5-20 parts by weight selected from additives represented by chemical formulas (I)-(IV). In chemical formula II, n is an integer of 2-6. In chemical formula III, R^8 and R^9 are respectively independent and represents hydrogen atom or C1-10 alkoxy group; and R^10 is C1-20 alkyl group or aryl group.</p> |
申请公布号 |
KR100913058(B1) |
申请公布日期 |
2009.08.20 |
申请号 |
KR20080082809 |
申请日期 |
2008.08.25 |
申请人 |
KOREA KUMHO PETROCHEMICAL CO., LTD. |
发明人 |
PARK, JOO HYEON;SON, KYUNG CHUL;CHO, JUNG HWAN |
分类号 |
G03F7/039;G03F7/004 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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